Introduction

The device use Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate.

Magnetic Method (F-type probe)

When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. The thickness of the cover layer can be derived by measuring the change.

Features

1、Thickness measurement using both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.

2、Single-point or two-point method could be used to correct probe system deviation, in order to ensure the accuracy of the device in the process of measuring.

3、Automatic identify ferrous and non-ferrous substrate quickly.

4、 Power voltage indicator.

5、Speaker beep while operating.

6、Power-off automatically when idle; manually power-off available.

7、Negative display function to ensure the accuracy of zero point calibration.

8、 Showing average, max, min value.

Specification

Model WH81

Principle Magnetic Method (F-type probe)

Range 0-1250um

Accuracy error zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3% H)] H + 1.5

Power 2 * AA battery

Unit Um/mil

Temperature 0-40 ℃

Humidity ≤85%

Minimum substrate 10 * 10mm

Minimum curvature 5mm convex; 5mm concave

Thinnest substrate 0.4mm

Weight 99g

Size 110mm * 65mm * 30mm

Standard Accessories meter, standard films*5, base substrate (1/2), AA dry cell*2, packing box, user manual