Introduction

The device use both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate.

Magnetic Method (F-type probe)

When the probe contacts the cover layer, the probe and magnetic substrate forms a closed magnetic circuit; Due to the presence of non-magnetic coating, magnetic resistance changes. 

The thickness of the cover layer can be derived by measuring the change.

Eddy Current Method (NF-type probe)

When the probe contacts the cover layer, the probe and non-magnetic substrate forms Eddy Current and gives feedback to the coil inside the probe.

The thickness of the cover layer can be derived by measuring the feedback.

Features

1、Thickness measurement using both Magnetic Method to measure the non-magnetic coating on a magnetic metal substrate and Eddy Current Method to measure the non-conductive coating on a non-magnetic metal substrate.

2、Single-point or two-point method could be used to correct probe system deviation, in order to ensure the accuracy of the device in the process of measuring.

3、Automatic identify ferrous and non-ferrous substrate quickly.

4、 Power voltage indicator.

5、Speaker beep while operating.

6、Power-off automatically when idle; manually power-off available.

7、Negative display function to ensure the accuracy of zero point calibration.

8、 Showing average, max, min value.

Specification

Model WH92

Principle (Magnetic Method (F-type probe) & Eddy Current Method (NF-type probe)

Range 0-1500um

Accuracy error zero calibration ± (1 + 3% H); two-point calibration ± [(1% ~ 3% H)] H + 1.5

Power 2 * AA battery

Unit Um/mil

Temperature 0-40 ℃

Humidity ≤85%

Minimum substrate 10 * 10mm

Minimum curvature 5mm convex; 5mm concave

Thinnest substrate 0.4mm

Weight 99g

Size 110mm * 65mm * 30mm

Standard Accessories meter, standard films*5, base substrate (1/2), AA dry cell*2, packing box, user manual